Quant Phase

Quantitative structured illumination phase microscopy

We introduce a method for seeing transparent objects using an patterned mask and a digital processing algorithm. A known pattern is imaged on the sample plane containing a thick transparent object by placing a patterned mask in the field diaphragm of a bright field transmission microscope. The object distorts the pattern according to its optical path length (OPL) profile and an image of the distorted pattern is recorded. A digital processing algorithm then estimates the object's quantitative OPL profile based on a closed form analytical solution, which is derived using a ray optics model for objects with small OPL gradients. Applied Optics, SPIE, CPIA Best Poster.

Free for all uses. Invented at MOISL.